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UID:caa0e5b2-7df7-4162-b2c4-6d804b8d0d63@nexttoyou
DTSTAMP:20261106T165709Z
DTSTART:20261113T170000Z
DTEND:20261113T180000Z
SUMMARY:From Atoms to Devices - Multiscale Modeling of Interfaces in Solid
 -State Batteries
LOCATION:Discovery Park Building B155\, 3940 N Elm St.\, Denton\, TX 76207
DESCRIPTION:Dr. Yue Qi\, Joan Wernig Sorensen Professor of Engineering at 
 Brown University will present a seminar titled "From Atoms to Devices - M
 ultiscale Modeling of Interfaces in Solid-State Batteries" to the interes
 ted faculty and students at Discovery Park.\n\nAbstract\n\nSolid-state ba
 tteries promise high energy density and improved safety\, yet the challen
 ge often lies at the interfaces\, where ion transport\, charge transfer\,
  chemical reactions\, and mechanical deformation are strongly coupled. In
  this talk\, I will discuss how multiscale Multiphysics modeling can conn
 ect atomic-scale interfacial processes to device-level behavior\, focusin
 g on three questions that limit solid-state batteries. First\, to probe i
 nterface resistance\, we combine density functional theory (DFT)\, electr
 ochemical thermodynamics\, and continuum modeling to describe how electro
 ns and ionic defects redistribute when two materials are brought into ele
 ctrochemical equilibrium. A recent multi-ion space-charge-layer model sho
 ws that Li defects\, oxygen defects\, and electrons can all contribute to
  interfacial charge transfer\, producing state-of-charge-dependent potent
 ial drops and band bending. These predictions are connected with experime
 ntal probes of local potentials and defect distributions\, providing a fr
 amework for understanding intrinsic interface resistance. Second\, we pre
 dict dynamic interface evolution during Li stripping\, which couples inte
 rfacial adhesion\, atomic hopping\, Li metal creep\, surface roughness\, 
 and \n\nhttp://next-to-u.app/events/caa0e5b2-7df7-4162-b2c4-6d804b8d0d63
URL:http://next-to-u.app/events/caa0e5b2-7df7-4162-b2c4-6d804b8d0d63
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